Nanomaterials-based PEM electrodes by combining chemical and physical depositions, Giorgi, R., Giorgi L., Gagliardi S., Salernitano E., Alvisi Marco, Dikonimos Th., Lisi N., Valerini D., De Riccardis Maria Federica, and Serra Emanuele , Journal of Fuel Cell Science and Technology, Volume 8, Number 4, (2011)

Sputter deposition of Pt nanoclusters and thin films on PEM fuel cell electrodes, Alvisi, Marco, Galtieri G., Giorgi L., Giorgi R., Serra Emanuele, and Signore M.A. , Surface and Coatings Technology, Volume 200, Number 5-6, p.1325-1329, (2005)

Momentum transfer parameter in argon-assisted carbon coatings, Rizzo, A., Alvisi Marco, Sarto F., and Scaglione S. , Thin Solid Films, Volume 384, Number 2, p.215-222, (2001)

Sputter deposited cerium-vanadium oxide: Optical characterization and electrochromic behavior, Masetti, E., Varsano F., Decker F., and Krasilnikova A. , Electrochimica Acta, Volume 46, Number 13-14, p.2085-2090, (2001)

Use of XPS for the study of cerium-vanadium (electrochromic) mixed oxides, Salvi, A.M., Decker F., Varsano F., and Speranza G. , Surface and Interface Analysis, Volume 31, Number 4, p.255-264, (2001)

Comparison of the optical properties and UV radiation resistance of HfO2 single layers deposited by reactive evaporation, IAD, and PIAD, Thielsch, Roland, Feigl Torsten, Kaiser Norbert, Martin Sven, Scaglione Salvatore, Sarto Francesca, Alvisi Marco, and Rizzo Antonella , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3902, Boulder, CO, USA, p.182-193, (2000)

Effects of structural properties and electric field distribution on the laser-damage threshold of HfO2 thin films, Protopapa, Maria Lucia, Alvisi Marco, Di Giulio M., de Tomasi F., Perrone M.R., Torsello G., and Valentini A. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 4070, Potenza-Lecce, Italy, p.380-386, (2000)

HfO2 films with high laser damage threshold, Alvisi, Marco, Di Giulio M., Marrone S.G., Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Thin Solid Films, Volume 358, Number 1, p.250-258, (2000)

Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)

Dual ion beam sputtering coating of plastic substrates: Improvement of film/substrate adhesion by minimizing the total stress at the interface, Sarto, F., Alvisi Marco, Caneve L., AbuHassan L.H., and Scaglione S. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.66-75, (1999)

Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Thin Solid Films, Volume 338, Number 1-2, p.269-275, (1999)

Optical and mechanical properties of diamond like carbon produced by dual ion beam sputtering technique, Scaglione, Salvatore, Sarto Francesca, Pepe Raffaele, Rizzo Antonella, and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.58-65, (1999)

Optical characterization of cerium-vanadium mixed oxide films for electrochromic devices, Varsano, F., Krasilnikova A., Decker F., and Masetti E. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.97-101, (1999)

Oxide films made by radio frequency sputtering of solid and powder targets: A comparison, Krasilnikova, A., Masetti E., Varsano F., and Bauer E.M. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.469-473, (1999)

Performances of an electrochromic device based on WO3 oxide and Ce-V mixed oxide thin films, Bauer, E.M., Varsano F., Decker F., and Masetti E. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.474-478, (1999)

Sputter-deposited cerium vanadium mixed oxide as counter-electrode for electrochromic devices, Masetti, E., Varsano F., and Decker F. , Electrochimica Acta, Volume 44, Number 18, p.3117-3119, (1999)

The influence of ion mass and energy on the composition of IBAD oxide films, Rizzo, A., Alvisi Marco, Sarto F., Scaglione S., and Vasanelli L. , Surface and Coatings Technology, Volume 108-109, p.297-302, (1998)

Size and shape effect on the magnetic properties of α-Fe2O3 nanoparticles, Suber, L., Zysler R., A. Santiago García, Fiorani D., Angiolini M., Montone Amelia, and Dormann J.L. , Materials Science Forum, Volume 269-272, Number PART 2, p.937-942, (1998)

Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)

Tungsten trioxide (WO3) sputtered thin films for a NOx gas sensor, Penza, Michele, Tagliente M.A., Mirenghi L., Gerardi C., Martucci C., and Cassano Gennaro , Sensors and Actuators, B: Chemical, Volume 50, Number 1, p.9-18, (1998)

SAW NOx gas sensor using WO3 thin-film sensitive coating, Penza, Michele, and Vasanelli L. , Sensors and Actuators, B: Chemical, Volume 41, Number 1-3, p.31-36, (1997)

X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo A., Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)