Grain boundary location control by patterned metal film in excimer laser crystallized polysilicon, Mariucci, L., Carluccio R., Pecora A., Fortunato G., Massussi F., Foglietti V., Della Sala Dario, and Stoemenos J. , Diffusion and Defect Data Pt.B: Solid State Phenomena, Volume 67, Schwabisch Gmund, Ger, p.175-180, (1999)