Produzione scientifica
Found 3 results
Filtri: Parola Chiave is Atomic force microscopy and Autore is Rizzo, A. [Clear All Filters]
Effect of the substrate temperature on zirconium oxynitride thin films deposited by water vapour-nitrogen radiofrequency magnetron sputtering,
, Thin Solid Films, Volume 518, Number 8, p.1943-1946, (2010)
Structural and chemical investigation of surface and interface of multilayer optical coatings deposited by DIBS,
, Applied Surface Science, Volume 157, Number 1, p.52-60, (2000)
Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy,
, Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)