Fine trimming of SmS film resistance by XeCl laser ablation, Miodushevsky, P., Protopapa Maria Lucia, de Tomasi F., Perrone M.R., Tundo S., and Vasanelli L. , Thin Solid Films, Volume 359, Number 2, p.251-254, (2000)

Laser damage testing of SiO2 and HfO2 thin films, Di Giulio, M., Alvisi Marco, Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.337-346, (1999)