Produzione scientifica
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Filtri: Autore is Torsello, G. and Parola Chiave is Hafnium compounds [Clear All Filters]
Effects of structural properties and electric field distribution on the laser-damage threshold of HfO2 thin films,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 4070, Potenza-Lecce, Italy, p.380-386, (2000)