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The effect of slippage on the saturated power in short pulse FEL SASE devices

TitoloThe effect of slippage on the saturated power in short pulse FEL SASE devices
Tipo di pubblicazioneArticolo su Rivista peer-reviewed
Anno di Pubblicazione2019
AutoriDattoli, G., Nguyen F., Pagnutti S., and Sabia E.
RivistaOptik
Volume179
Paginazione680-683
ISSN00304026
Parole chiaveCombined effect, Device parameters, Electron bunch lengths, Electrons, Free electron lasers, Laser pulses, Laser-pulse power, Particle beam bunching, Possible mechanisms, SASE, Saturated power, Self-amplified spontaneous emission
Abstract

The combined effect of slippage and energy spread in self-amplified-spontaneous-emission Free Electron Laser devices, operating in single spike regime, may impose limitations on the relevant performance. If the slippage is larger than the electron bunch length, the saturated power is significantly reduced. We provide a simple scaling formula capable of parameterizing the effect in terms of the device parameter and discuss possible mechanisms allowing the power output optimization. © 2018 Elsevier GmbH

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85056565112&doi=10.1016%2fj.ijleo.2018.10.156&partnerID=40&md5=3e66a1a52e5b3c2c6f3590b53a8d9753
DOI10.1016/j.ijleo.2018.10.156
Citation KeyDattoli2019680