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Lithium diffusion in cerium-vanadium mixed oxide thin films: A systematic study

TitoloLithium diffusion in cerium-vanadium mixed oxide thin films: A systematic study
Tipo di pubblicazioneArticolo su Rivista peer-reviewed
Anno di Pubblicazione2001
AutoriVarsano, F., Decker F., Masetti E., and Croce F.
RivistaElectrochimica Acta
Volume46
Paginazione2069-2075
ISSN00134686
Parole chiaveCerium compounds, Cerium vanadium mixed oxide, Conductive films, Diffusion in solids, Intercalation compounds, Ionic conduction in solids, Lithium, Oxides, Spectroscopic analysis
Abstract

Three electroanalytical techniques have been used to study the solid-state ionic diffusion of lithium into cerium-vanadium mixed oxide thin films, i.e. potentiostatic intermittent titration technique, galvanostatic intermittent titration technique and electrochemical impedance spectroscopy. Diffusion coefficients measured with the above mentioned techniques show a non-monotonic decay between 8 × 10-12 and 8 × 10-14 cm2s-1. In particular, lithium diffusion coefficient drops by more than one order of magnitude at lithium intercalation degree x = 0.6. This abrupt change seems to be related to a dramatic increase of the material resistance suggesting that the limiting factor in atomic lithium diffusion may be the low electronic conductivity. © 2001 Elsevier Science Ltd.

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-0035794635&doi=10.1016%2fS0013-4686%2801%2900408-X&partnerID=40&md5=dee99b6fa2b6a1dd1ef321e6daeb6248
DOI10.1016/S0013-4686(01)00408-X
Citation KeyVarsano20012069