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P-type strontium-copper mixed oxide deposited by e-beam evaporation

TitoloP-type strontium-copper mixed oxide deposited by e-beam evaporation
Tipo di pubblicazioneArticolo su Rivista peer-reviewed
Anno di Pubblicazione2003
AutoriBobeico, E., Varsano F., Minarini Carla, and Roca F.
RivistaThin Solid Films
Volume444
Paginazione70-74
Parole chiaveCopper compounds, Electric properties, evaporation, Mixed oxides, Strontium, Thin films
Abstract

P-type thin films of strontium-copper mixed oxide have been deposited by e-beam evaporation technique on glass and quartz substrates starting from SrCu2O2 powders. A study of optical, electrical and structural properties was performed on the thin films, varying deposition parameters such as the substrate temperature and the oxygen partial pressure. For the first time, polycrystalline films of SrCu2O2 were obtained using e-beam evaporation in O2 atmosphere at relatively low temperature (350 °C) with transparency of over 60% in the visible light range and a high optical transmittance in near-infrared region. The optical band gap of thin film was estimated to be ∼3.12 eV. Seebeck and Hall effects measurements confirmed the p-type nature of semiconductors and conductivity as high as 5.3×10-2 S/cm for non-intentionally doped materials was measured. Hole concentration and mobility at room temperature were 1.5×1017 cm-3 and 2.2 cm 2/Vs, respectively. X-Ray diffraction measurements revealed a polycrystalline structure of the films. © 2003 Elsevier B.V. All rights reserved.

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-0142043306&doi=10.1016%2fS0040-6090%2803%2901023-X&partnerID=40&md5=b08a03d13988ddc7a1d9d69899d9d743
DOI10.1016/S0040-6090(03)01023-X
Citation KeyBobeico200370