Nitrogen removal optimization in a sequencing batch reactor treating sanitary landfill leachate, Spagni, A., Lavagnolo M.C., Scarpa C., Vendrame P., Rizzo A., and Luccarini L. , Journal of Environmental Science and Health - Part A Toxic/Hazardous Substances and Environmental Engineering, Volume 42, Number 6, p.757-765, (2007)

U-series and radiocarbon dates on mollusc shells from the uppermost layer of the archaeological site of KHB-1, Ra's al Khabbah, Oman, Magnani, G., Bartolomei P., Cavulli F., Esposito M., Marino E.C., Neri M., Rizzo A., Scaruffi S., and Tosi M. , Journal of Archaeological Science, Volume 34, Number 5, p.749-755, (2007)

Properties of ZrNx films with x > 1 deposited by reactive radiofrequency magnetron sputtering, Rizzo, A., Signore M.A., Mirenghi L., and Serra Emanuele , Thin Solid Films, Volume 515, Number 4, p.1307-1313, (2006)

RF sputtering deposition of alternate TiN/ZrN multilayer hard coatings, Rizzo, A., Signore M.A., Penza Michele, Tagliente M.A., De Riccardis Maria Federica, and Serra Emanuele , Thin Solid Films, Volume 515, Number 2 SPEC. ISS., p.500-504, (2006)

TRF2 inhibition triggers apoptosis and reduces tumourigenicity of human melanoma cells, Biroccio, A., Rizzo A., Elli R., Koering C.-E., Belleville A., Benassi Barbara, Leonetti C., Stevens M.F.G., D'Incalci M., Zupi G., et al. , European Journal of Cancer, Volume 42, Number 12, p.1881-1888, (2006)

Low cost technique for measuring in situ strain of nanostructures, Rizzo, A., Capodieci Laura, Rizzo D., and Galietti U. , Materials Science and Engineering C, Volume 25, Number 5-8, p.820-825, (2005)

Biological activity of the G-quadruplex ligand RHPS4 (3, 11-difluoro-6,8,13-trimethyl-8H-quino[4,3,2-kl]acridinium methosulfate) is associated with telomere capping alteration, Leonetti, C., Amodei S., D'Angelo C., Rizzo A., Benassi Barbara, Antonelli A., Elli R., Stevens M.F.G., D'Incalci M., Zupi G., et al. , Molecular Pharmacology, Volume 66, Number 5, p.1138-1146, (2004)

Multiple spot mirrors as total reflectors inside stable XeCl laser cavities, Rizzo, A., Aghamkar P., de Tomasi F., Perrone M.R., Protopapa Maria Lucia, and Scaglione S. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 4829 II, Firenze, p.678-680, (2003)

Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films, Alvisi, Marco, de Tomasi F., Perrone M.R., Protopapa Maria Lucia, Rizzo A., Sarto F., and Scaglione S. , Thin Solid Films, Volume 396, Number 1-2, p.44-52, (2001)

Momentum transfer parameter in argon-assisted carbon coatings, Rizzo, A., Alvisi Marco, Sarto F., and Scaglione S. , Thin Solid Films, Volume 384, Number 2, p.215-222, (2001)

Structural and optical properties of silver thin films deposited by RF magnetron sputtering, Rizzo, A., Tagliente M.A., Alvisi Marco, and Scaglione S. , Thin Solid Films, Volume 396, Number 1-2, p.29-35, (2001)

Influence of the momentum transfer on the structural and optical properties of ZnSe thin films prepared by r.f. magnetron sputtering, Rizzo, A., Tagliente M.A., Caneve L., and Scaglione S. , Thin Solid Films, Volume 368, Number 1, p.8-14, (2000)

Structural and chemical investigation of surface and interface of multilayer optical coatings deposited by DIBS, Alvisi, Marco, Mirenghi L., Tapfer Leander, Rizzo A., Ferrara Maria Cristina, Scaglione S., and Vasanelli L. , Applied Surface Science, Volume 157, Number 1, p.52-60, (2000)

Adhesion enhancement of optical coatings on plastic substrate via ion treatment, Sarto, F., Alvisi Marco, Melissano E., Rizzo A., Scaglione S., and Vasanelli L. , Thin Solid Films, Volume 346, Number 1, p.196-201, (1999)

Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)

Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Thin Solid Films, Volume 338, Number 1-2, p.269-275, (1999)

Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance, Alvisi, Marco, Scaglione S., Martelli S., Rizzo A., and Vasanelli L. , Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)

Structural and optical properties of zinc selenide thin films deposited by RF magnetron sputtering, Rizzo, A., Caneve L., Scaglione S., and Tagliente M.A. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.40-47, (1999)

Effects of substrate temperature on the laser damage threshold of sputtered SiO2 films, Alvisi, Marco, De Nunzio G., Ferrara Maria Cristina, Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Volume 16, Number 6, p.3408-3413, (1998)

The influence of ion mass and energy on the composition of IBAD oxide films, Rizzo, A., Alvisi Marco, Sarto F., Scaglione S., and Vasanelli L. , Surface and Coatings Technology, Volume 108-109, p.297-302, (1998)

Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Conference on Lasers and Electro-Optics Europe - Technical Digest, Glasgow, Scotland, p.311, (1998)

Physical characterization of hafnium oxide thin films and their application as gas sensing devices, Capone, S., Leo G., Rella R., Siciliano P., Vasanelli L., Alvisi Marco, Mirenghi L., and Rizzo A. , Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Volume 16, Number 6, p.3564-3568, (1998)

Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)

X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo A., Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)