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Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique

TitleLaser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique
Publication TypePresentazione a Congresso
Year of Publication1998
AuthorsAlvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L.
Conference NameConference on Lasers and Electro-Optics Europe - Technical Digest
PublisherIEEE, Piscataway, NJ, United States
Conference LocationGlasgow, Scotland
KeywordsAcoustooptical effects, Coatings, Fabrication, Film growth, Fused silica, Helium neon lasers, Ion beams, Laser damage, Light transmission, Mirrors, Photoacoustic mirage technique, Pulsed laser applications, Refractive index, Thin films
Abstract

The dual ion beam sputtering technique has been used to grow SiO2 thin films on fused silica substrates. The role of some deposition parameters on the coating laser-induced damage threshold (LIDT) has been investigated. Results indicate that a proper choice of the assisting-ion-beam parameters allows to optimize the coating quality and to increase its damage threshold.

URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-0031625338&partnerID=40&md5=6a26049a4c5f7560d0b9b53f1546f137
Citation KeyAlvisi1998311