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Analysis of HMDS self-assembled monolayer Effect on Trap Density in PC70BM n-type Thin Film Transistors through Admittance Studies

TitleAnalysis of HMDS self-assembled monolayer Effect on Trap Density in PC70BM n-type Thin Film Transistors through Admittance Studies
Publication TypePresentazione a Congresso
Year of Publication2017
AuthorsMinarini, C., Maglione Maria Grazia, and Tassini Paolo
Conference NameMATERIALS TODAY: PROCEEDINGS
PublisherElsevier Ltd
KeywordsAdmittance Spectroscopy, Equivalent Circuit Model, OTFTs, PC70BM, SAM, Trap Density
URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85024132234&doi=10.1016%2fj.matpr.2017.04.113&partnerID=40&md5=506894c193804ac26f6880c11ae74916
DOI10.1016/j.matpr.2017.04.113
Citation Key 20.500.12079_3653