Structural studies of thin films of semiconducting nanoparticles in polymer matrices

TitleStructural studies of thin films of semiconducting nanoparticles in polymer matrices
Publication TypeArticolo su Rivista peer-reviewed
Year of Publication2007
AuthorsDi Luccio, Tiziana, Piscopiello E., Laera A.M., and Antisari M.V.
JournalMaterials Science and Engineering C
Volume27
Pagination1372-1376
ISSN09284931
KeywordsBioelectronics, Catalysis, Copolymers, Cyclo-olephin copolymer (COC), Nanoparticles, Nanoscale materials, Polymer films, Polymer matrix, Semiconducting nanoparticles, Thin films, Zinc sulfide
Abstract

Ordered films of nanoscale materials are issue of wide interest for applications in several fields, such as optics, catalysis, and bioelectronics. In particular, semiconducting nanoparticles incorporation in a processable polymer film is an easy way to manipulate such materials for their application. We deposited thin layers of cadmium sulphide (CdS) and zinc sulphide (ZnS) nanoparticles embedded in a thermoplastic cyclo-olephin copolymer (COC) with elevated optical transparency and highly bio-compatible. The nanoparticles were obtained by thiolate precursors previously dispersed in the polymer upon thermal treatment at temperatures ranging between 200 and 300 °C depending on the desired size. The precursor/polymer solutions were spin-coated in order to get thin films. The spinning conditions were changed in order to optimise the layer thickness and uniformity. The samples were mainly characterised by X-ray reflectivity (XRR) and by high-resolution transmission electron microscopy (HRTEM) analyses. The thinnest layer we have deposited is 8 nm thick, as evaluated by XRR. The HRTEM measurements showed that the nanoparticles have quasi-spherical shape without evident microstructural defects. The size of the nanoparticles depends on the annealing temperature, e.g. at 232 °C the size of the CdS nanoparticles is about 4-5 nm. © 2006 Elsevier B.V. All rights reserved.

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-34547687510&doi=10.1016%2fj.msec.2006.07.018&partnerID=40&md5=de49b00d10bdfc517909125e2c2c8633
DOI10.1016/j.msec.2006.07.018