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Produzione Scientifica

Found 57 results
Filters: Author is Leander Tapfer  [Clear All Filters]
1997
Glancing-incidence X-ray characterization of Nb/Pd multilayers, Tagliente, M.A., Del Vecchio A., Tapfer Leander, Coccorese C., Mercaldo L., Maritato L., Slaughter J.M., and Falco C.M. , Nuovo Cimento della Societa Italiana di Fisica D - Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics, Volume 19, Number 2-4, p.473-480, (1997)
X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo Antonella, Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)
1996
Structural, compositional, and optical characterization of thin TiOxNy coatings fabricated by dual ion beam sputtering, Rizzo, Antonella, Mirenghi L., Tapfer Leander, Alvisi Marco, Vasanelli L., Sarto F., and Scaglione Salvatore , Proceedings of SPIE - The International Society for Optical Engineering, Volume 2776, Glasgow, UK, p.392-399, (1996)