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Produzione Scientifica

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Filters: Author is Fameli, G.  [Clear All Filters]
Characterisation of thin amorphous silicon films with multiple internal reflectance spectroscopy, Fameli, G., Della Sala Dario, Roca F., and Gerardi C. , Journal of Non-Crystalline Solids, Volume 198-200, Number PART 1, p.69-72, (1996)