New approach in Auger elemental relative sensitive factor calculation by using TEM-EDS analysis based on bi-layers of pure elements, Mello, D., Nacucchi Michele, Anastasi G., Sacchi M., Ricciari R., Burresi Emiliano, and Tapfer Leander , Ultramicroscopy, Volume 193, p.143-150, (2018)

Welding of IN792 DS superalloy by electron beam, Montanari, R., Varone A., Barbieri Giuseppe, Soltani P., Mezzi A., and Kaciulis S. , Surface and Interface Analysis, Volume 48, Number 7, p.483-487, (2016)

Influence of doping concentration on the photoluminescence of silicon nanocrystals, Lettieri, S., Maddalena P., Di Francia G., and Morvillo Pasquale , Physica Status Solidi (A) Applied Research, Volume 197, Number 2, Puerto de la Cruz, p.399-402, (2003)

Use of XPS for the study of cerium-vanadium (electrochromic) mixed oxides, Salvi, A.M., Decker F., Varsano F., and Speranza G. , Surface and Interface Analysis, Volume 31, Number 4, p.255-264, (2001)