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Produzione Scientifica

Found 8 results
Filters: Keyword is Secondary ion mass spectrometry  [Clear All Filters]
2002
Properties of (In,Ga)N/GaN quantum wells grown by plasma-assisted molecular beam epitaxy, Brandt, O., Waltereit P., Dhar S., Jahn U., Sun Y.J., Trampert A., Ploog K.H., Tagliente M.A., and Tapfer Leander , Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Volume 20, Number 4, Santa Fe, NM, p.1626-1639, (2002)
2001
On the influence of carbon implantation on the structural properties of hard TiN coatings studied by glancing incidence X-ray diffraction, Tagliente, M.A., Falcone R., Mello D., Esposito C., and Tapfer Leander , Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Volume 179, Number 1, p.42-54, (2001)
Structural properties of carbon-implanted TiN coatings studied by glancing-incidence X-ray diffraction, Tagliente, M.A., Falcone R., Mello D., Esposito C., and Tapfer Leander , Materials Science Forum, Volume 378-381, Number II, Barcelona, p.723-728, (2001)
1998
SAW gas detection using Langmuir-Blodgett polypyrrole films, Milella, E., and Penza Michele , Thin Solid Films, Volume 327-329, Number 1-2, p.694-697, (1998)
Tungsten trioxide (WO3) sputtered thin films for a NOx gas sensor, Penza, Michele, Tagliente M.A., Mirenghi L., Gerardi C., Martucci C., and Cassano Gennaro , Sensors and Actuators, B: Chemical, Volume 50, Number 1, p.9-18, (1998)